Tescan has launched the brand new technology of Tescan CLARA™, an ultra-high-resolution scanning electron microscope for nanoscale supplies characterization. The system combines low-energy high-resolution SEM imaging, multi-contrast detection, assist for difficult supplies, and sooner navigation from setup to outcomes for analysis laboratories, shared microscopy amenities, and industrial R&D environments.
The brand new CLARA™ is meant for work in supplies science, nanotechnology, superior manufacturing, industrial R&D, and shared microscopy amenities. It helps imaging and evaluation throughout a spread of pattern varieties, together with polymers, magnetic supplies, metals, ceramics, coatings, particles, and failure evaluation samples.
“In supplies analysis, essential info is usually present in refined floor constructions, skinny layers, native composition modifications, or options which might be troublesome to picture with out altering the pattern,” stated Sirine Assaf, CRO at Tescan. “CLARA™ is designed to assist this work by combining low-energy imaging, wealthy detection, and sensible workflow management in a single platform.”
Clearer Nanoscale Imaging with Much less Pattern Preparation
Many essential materials options can solely be understood on the nanoscale. CLARA™ allows ultra-high-resolution imaging at low power ranges, which is particularly invaluable when working with delicate, non-conductive, or beam-sensitive samples.
Low-energy imaging helps researchers observe tremendous floor constructions whereas decreasing the necessity for added preparation steps resembling conductive coating. This enables groups to check supplies nearer to their pure state and scale back the chance of preparation artifacts.
For researchers learning nanoparticles, skinny floor layers, coatings, contamination, or small defects, this mix of decision and pattern safety helps the interpretation of tremendous structural and materials options.
Extra Perception From Each Measurement
CLARA™ is designed to gather complementary kinds of info from the identical space of a pattern, serving to researchers distinguish floor element from materials variations.
This multi-contrast method may also help establish near-surface particles, contamination layers, composition modifications, or materials variations which may be troublesome to separate from topographic distinction alone.
Analytical Flexibility for Analysis and Industrial Laboratories
Trendy analysis and industrial laboratories hardly ever work with one easy pattern sort. In the future could contain a conductive steel, the following a polymer, magnetic materials, porous construction, coating, fracture floor, or delicate prototype element.
CLARA™ helps high-resolution SEM imaging throughout difficult supplies and provides low-vacuum functionality for samples that cost, outgas, or require gentler imaging situations. Researchers can adapt imaging situations to the pattern somewhat than forcing the pattern into a hard and fast workflow.
The system additionally helps a spread of analytical methods, enabling laboratories to attach high-resolution imaging with deeper materials evaluation. CLARA™ is suited to functions in superior supplies analysis, electronics, power supplies, metallurgy, polymers, coatings, nanotechnology, failure evaluation, and high quality management.
With CLARA™, Tescan continues to develop electron microscopy options that mix efficiency, usability, and analytical flexibility for routine and superior nanoscale characterization.
