Park Methods Corp., the world’s main supplier of atomic power microscopy (AFM) options, immediately introduced the launch of the NX1 – a compact, high-performance AFM that delivers atomic decision imaging in ambient situations. Developed in collaboration with Prof. Franz J. Giessibl of the College of Regensburg, one of many world’s foremost authorities on atomic decision AFM, the NX1 brings a category of imaging efficiency beforehand confined to ultra-high vacuum environments into the attain of analysis labs worldwide.
(Left to proper) Prof. Franz J. Giessibl (College of Regensburg) and Dr. Sang-il Park (Founder & CEO, Park Methods). Picture Credit score: Park Methods
The NX1 relies on Orpheus II, a prototype developed by Prof. Giessibl’s group at Regensburg that demonstrated atomic decision imaging in ambient situations was achievable. Park Methods engineered that idea into a completely realized industrial product – combining the Orpheus II’s confirmed core structure, together with a Kovar physique for distinctive thermal stability, with Park Methods’ precision manufacturing, product reliability, and world AFM engineering experience. The result’s an instrument that achieves a noise ground about an order of magnitude decrease than standard AFM programs, making atomic-scale imaging accessible in on a regular basis laboratory settings.
“The NX1 is the results of combining Prof. Giessibl’s pioneering analysis with Park Methods’ confirmed skill to carry the world’s most superior science to market,” mentioned Dr. Sang-Joon Cho, Govt Vice President and Head of the Analysis Gear Enterprise Unit at Park Methods. “Collectively, we have now created one thing that neither aspect might have achieved alone: a very dependable, supportable, and accessible instrument for researchers worldwide. That is the type of platform that creates and shapes new markets.”
The Park NX1 Atomic Power Microscope, designed for atomic-scale imaging in ambient situations. Picture Credit score: Park Methods
Designed for each efficiency and on a regular basis usability, the NX1 helps commonplace silicon cantilevers in addition to an optionally available qPlus (quartz tuning fork) sensor – enabling picometer-scale oscillation amplitudes and the excessive sensitivity to short-range forces. Probe alternate is simplified by way of a pre-aligned kinematic chip service system, and an built-in on-axis optical microscope gives a direct view of the probe and pattern all through operation. The system is totally suitable with Park Methods’ SmartScan™ working software program and SmartAnalysis™ picture evaluation platform.
“Orpheus II proved the idea, however it was a analysis instrument – for specialists solely,” mentioned Prof. Franz J. Giessibl, College of Regensburg. “The experience of Park Methods was important to make this right into a dependable product that the broader analysis neighborhood can use. The NX1 is what the concept at all times had the potential to grow to be.”
The NX1 is now obtainable for order. For technical specs and utility knowledge, go to https://www.parksystems.com/en/merchandise/research-afm/small-sample-afm/nx1
